WebbここではTOF-SIMS 装置の簡単な原理,測定,スペ クトルを解析する際の基本的な留意点,実際の応用 例について述べる. 1. TOF-SIMS とは TOF-SIMS はTime-Of-Flight … WebbOn the other hand, TOF-SIMS is a technique that can detect elemental and molecular information existing on the outermost surface of a sample with a low primary ion beam dose (1×10 12 atoms/cm 2 or less). It is also called static SIMS because there is so little sputtering (<0.1% of a monolayer) during data acquisition that the surface is “static”.
TOF-SIMS测试常见的问题及解答(二) - 知乎 - 知乎专栏
WebbTOF-SIMS typically uses heavy ions (Bi, Au, Ga.) suitable for detection of molecular information on the surface, These species can be made easily into finely-focused ion … WebbA SIMS (secondary ion mass spectrometry) detector enables sensitive surface analysis for many industrial and research applications. The technique provides detailed elemental … newmarket financial canton ohio
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http://ac.tsinghua.edu.cn/fwzn/sfbz.htm Webb20 apr. 2024 · TOF-SIMS原位表面分析支撑锂金属负极研究 2024-04-20 369 近年来,锂金属负极因其高达3860 mAh/g的理论比容量,再次成为了学术领域和产业界关注的焦点。 … Webbsims(二次离子质谱)可以在许多工业和研究领域中实现极为灵敏的表面元素成分分析。 该技术可提供有关样品的详细元素和同位素信息,并能够进行深度剖析分析。 in transit vs out for delivery usps